[Music]
welcome everybody
to the demo part of this live event my
name is nicholas norberg
and i would like to introduce you to the
latest innovations that we implemented
on the aeris platform
and in the first part i would like to
demonstrate to you the grazing incidence
x-ray diffraction application that we
now
added to our aries portfolio grazing
incidence diffraction as opposed to
conventional breakpentano measurements
is usually performed on thin film
samples
and thin film samples are nothing else
than thin
film materials that are deposited on
some kind of substrate which can either
be a metal sample
a glass sample or a single crystal so
for that
the bregmentano measurement approach is
not the best because
the penetration depth into the sample is
far too large
only to qualify the deposited layer
so that means bregmentano is usually
only performed
on bulk mineralogical samples so
in order to be able to perform grazing
incidence diffraction
you need a parallel beam setup because a
grazing incidence measurement is
performed as a fixed
constant very low angle of incidence in
order to maximize the interaction of the
incoming x-rays with
the very thin layer so in order to be
able to perform this measurement we
decided to change our optical
concept on the secondary beam path and
to make it more flexible to allow the
user to change between
different uh beam geometries for example
the typical brachmantano periph
power focusing beam geometry and the
parallel beam
geometry that you need for grazing
incidents that we achieved by
introducing
a prefix on prefix concept on the
secondary side
which you can see here and in addition
to the normal prefix that we use to
mount the whole optical beam path onto
the goniometer we introduced the second
prefix
with which you can mount and dismount
the optical component
in front of the detector so in this case
this is a fixed anti-scatter slit
and for a grazing incidence measurement
for example you would switch to a
parallel plate collimator
so and this is what we're going to use
for our first
demonstration so in order to demonstrate
the benefits
of grazing incidence measurements on
thin films
the easiest way is just to show the two
different measurement geometries
so i've selected a thin film sample
for this demonstration which is an
indium tin oxide
that is deposited on glass it is quite a
thin layer
so in a normal brachmantana measurement
you get a lot of interaction from the
substrate
and we will begin by measuring uh a
brackpentano measurement
so typical go new scan and afterwards we
will switch the parallel beam geometry
and perform a grazing incidence
measurement
so now i've pre-prepared a bragpantano
measurement that is roughly two minutes
long
and i will simply start it so
what you will now see is this that the
sample is picked up
by the sample gripper it is put onto the
sample loader
and then introduced into the system as
you can see the whole user interaction
with the instrument happens outside
of the instrument which means that the
user itself doesn't have to access the
inside of the system
at all times this also prevents from
contamination
and also makes also the the life of the
user much much more simple
so now the measurement is running and
the data is being generated
as you can already see in the beginning
of the measurement you get
small peaks those are the peaks of the
of the thin film
but you also get a very high background
and that is actually the signal that
comes from the glass substrate
and the signal from the substrate is is
a result
of the larger penetration that we have
in this
beam geometry into the sample itself
so now the measurement is done
and we will now start the grazing
incidence measurement
for that i've also pre-prepared a
grazing incidence measurement program
and this is a measurement that measures
the exact same range that we have seen
in the breakpentano measurement however
at a constant angle of incidence of 0.7
degrees
omega
so now that i have uh selected the
measurement program the instrument
reminds me to change the setup
and it also specifies the components
that i'm supposed to change
which i will do now for that you simply
unlock the cover
which allows you to access the optical
components and
you set the instrument accordingly
so i'm taking out the fixed anti-scatter
slit
and i'm inserting the parallel plate
collimator
so then i use the three newt meter key
to have a reproducible force applied to
the prefix screws
i also take out the solar slit in order
to increase
the counting statistics and once i'm
done
i close the instrument i press continue
and then again the gripper will pick up
the sample
and introduce it into the instrument
so now the measurement starts and
for your convenience we decided to speed
up this measurement
because it is 16 minutes long
and which is why we decided to make it a
little bit
faster however you will still see the
live data being
recorded however just slightly faster
than in real time however you can still
fold the time at the bottom
to see that the measurement time is
indeed 16 minutes
now also the grazing incidence actually
measurement has finished and
i think in order to compare the two
techniques with each other
uh the best way is to look at the data
directly which will immediately
make the benefits of the grazing
incidence application clear to you
so for that i'm just going to open the
two scans that we now
just collected in our data viewer tool
and i compare them with each other and
you immediately see
so in the red scan which is the gracing
incident scan
and the blue scan is the bregmentano
scan you see in the red scan
the signal that we get from the indium
tin
oxide layer on top of the glass
substrate is maximized
so we can nicely see all the different
peaks even at high
angles which is not possible in the
breckpentano measurement
also the peak intensities are much much
higher
and the peak to background ratio is much
better in the grazing incidence
measurement
and also the the substrate signal is
minimized compared to the brackpentano
measurement
and yeah this already shows you the big
benefit of the technique
sure the measurement time is longer but
this is a result of the measurement
geometry itself
because we're using a parallel plate
collimator the pixel detector despite
being
a one-dimensional detector cannot be
used in 1d mode it has to be used in 0d
mode
because due to the parallel plate
collimator we only measure one
orientation at the time with the full
detector
even if we and there is no uh workaround
and that also explains the longer
measurement time but you can already see
the benefit
because despite the fact that you
measure longer you also gain a lot more
information from
thin layers and with that i would like
to say thank you for your attention